UHV AFM/STM
•
Contact and non-contact AFM, and STM
•
Lateral (friction) force detection
•
Electrostatic, magnetic force imaging
•
Simultaneous AFM and STM detection
For the imaging of surfaces ranging from non-conducting to conducting and from hard to soft and delicate samples, the UHV AFM/STM is the most versatile scanning probe microscope available. The optical beam deflection detection offers unsurpassed sensitivity for low forces in contact mode AFM imaging. Instantaneous switching between AFM and STM imaging modes and simultaneous STM and AFM imaging is possible.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Scanning Tunneling Microscopy (STM)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
Multi-Chamber System
(System Concept & Preparation Chamber Variations)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE LT
(Dedicated for Low Temperatures)
STM 1
(Room Temperature)
UHV AFM/STM
(Room Temperature)
Variable Temperature UHV SPM
(Variable Temperature Instruments)
LT STM
(Low Temperature Instruments)
Cryogenic SFM
(Low Temperature Instruments)
Cryogenic STM
(Low Temperature Instruments)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
Large Sample SPM
(Large Samples)
Large Sample Beam Defl. AFM
(Large Samples)
UHV NANOPROBE
(Multi-Technique SPMs)
STM/SEM Stage
(Multi-Technique SPMs)
MULTIPROBE Cryogenic
(Dedicated for Low Temperatures)
SPM PROBE
(Dedicated for SPM)
MULTISCAN LAB
(Combined SPM/SEM/SAM)
UHV NANOPROBE System
(4 Point Probe in UHV)
