Variable Temperature UHV SPM
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25 K - 1500 K
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Beam Deflection AFM
•
Needle - Sensor AFM
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True pA STM and Spectroscopy
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In - situ Evaporation Capability
The VT bolt-on-chamber allows the use of an evaporator (EFM 3 VT) during imaging.
More than 300 instruments have been delivered and successfully installed around the world since the first delivery of the original VT STMs in 1994 and the first VT AFMs in 1999. The volume of our customer’s research results and publications is final proof of the unbeatable performance, quality and versatility of the Variable Temperature design.
Up to two EFM 3 evaporators can be directly mounted on the VT chamber for in-situ growth, even during imaging, if the tip geometry permits.
The proven Omicron eddy current damping allows high-resolution SPM even in non-ideal conditions. Every instrument is capable of high performance STM and is available with either beam deflection AFM or "Needle Sensor" AFM.
With the integration of the new IVC H3 preamplifier, the VT AFM and VT STM have further raised the performance and versatility benchmarks for ultra-high vacuum (UHV) STM and AFM.
Optimum STM and STS performance is guaranteed in both the VT STM and VT AFM.
The fundamental difference between the two instruments is in their AFM capacity.
The VT AFM offers full beam deflection based AFM, supporting all common AFM measurement modes. The VT STM on the other hand is offered with the optional and upgradeable Needle Sensor AFM, an electrically-controlled, non-contact probe of surprising simplicity.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Scanning Tunneling Microscopy (STM)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
Multi-Chamber System
(System Concept & Preparation Chamber Variations)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE LT
(Dedicated for Low Temperatures)
STM 1
(Room Temperature)
UHV AFM/STM
(Room Temperature)
Variable Temperature UHV SPM
(Variable Temperature Instruments)
LT STM
(Low Temperature Instruments)
Cryogenic SFM
(Low Temperature Instruments)
Cryogenic STM
(Low Temperature Instruments)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
Large Sample SPM
(Large Samples)
Large Sample Beam Defl. AFM
(Large Samples)
UHV NANOPROBE
(Multi-Technique SPMs)
STM/SEM Stage
(Multi-Technique SPMs)
MULTIPROBE Cryogenic
(Dedicated for Low Temperatures)
SPM PROBE
(Dedicated for SPM)
MULTISCAN LAB
(Combined SPM/SEM/SAM)
UHV NANOPROBE System
(4 Point Probe in UHV)