MULTIPROBE MXPS
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Multi-technique surface analysis
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mono-XPS and UHV SPM
The MULTIPROBE MXPS ® is a multi-technique surface analysis system solution for mono-XPS and UHV SPM. It is optimised for use with the EA 125 series analysers and the XM 1000 or XM 500 (shown) monochromated X-ray sources. The X-ray spot size on the sample fulfils the requirements of the EA 125 for optimum intensity. In addition, the system geometry allows for dispersion compensation.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Scanning Tunneling Microscopy (STM)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
Multi-Chamber System
(System Concept & Preparation Chamber Variations)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE LT
(Dedicated for Low Temperatures)
STM 1
(Room Temperature)
UHV AFM/STM
(Room Temperature)
Variable Temperature UHV SPM
(Variable Temperature Instruments)
LT STM
(Low Temperature Instruments)
Cryogenic SFM
(Low Temperature Instruments)
Cryogenic STM
(Low Temperature Instruments)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
Large Sample SPM
(Large Samples)
Large Sample Beam Defl. AFM
(Large Samples)
UHV NANOPROBE
(Multi-Technique SPMs)
STM/SEM Stage
(Multi-Technique SPMs)
MULTIPROBE Cryogenic
(Dedicated for Low Temperatures)
SPM PROBE
(Dedicated for SPM)
MULTISCAN LAB
(Combined SPM/SEM/SAM)
UHV NANOPROBE System
(4 Point Probe in UHV)
