SPM PROBE
•
Sample Load Lock
•
Sample/Tip Preparation (Sputtering, Thin Film evaporation)
•
Sample Characterization (LEED)
•
State of the art UHV performance (< 1x10-10 mbar)
Ultra-compact and cost-effective UHV systems for Omicron's Variable Temperature UHV SPM, UHV AFM/STM, UHV STM 1, and the MICRO series. The rigid construction is ideally suited for high resolution SPM work. The systems are optimised to occupy only a minimum of laboratory space. Besides the UHV SPM, the experimental chamber features a fast sample introduction system, and can accommodate a number of auxilliary techniques for sample preparation.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Scanning Tunneling Microscopy (STM)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
Multi-Chamber System
(System Concept & Preparation Chamber Variations)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE LT
(Dedicated for Low Temperatures)
STM 1
(Room Temperature)
UHV AFM/STM
(Room Temperature)
Variable Temperature UHV SPM
(Variable Temperature Instruments)
LT STM
(Low Temperature Instruments)
Cryogenic SFM
(Low Temperature Instruments)
Cryogenic STM
(Low Temperature Instruments)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
Large Sample SPM
(Large Samples)
Large Sample Beam Defl. AFM
(Large Samples)
UHV NANOPROBE
(Multi-Technique SPMs)
STM/SEM Stage
(Multi-Technique SPMs)
MULTIPROBE Cryogenic
(Dedicated for Low Temperatures)
SPM PROBE
(Dedicated for SPM)
MULTISCAN LAB
(Combined SPM/SEM/SAM)
UHV NANOPROBE System
(4 Point Probe in UHV)
