Beam Deflection AFM with QPlus AFMCustomized
(Result of the month 05/2009)

Imaging of rest atoms (raw data) of the Si(111) 7x7 surface with QPlus AFM in an Omicron VT at 50 K (Left image). Line profile showing the height difference of the rest atoms (above).

Conventional cantilevers with typical spring constants of 10 N/m need large oscillation amplitudes to avoid 'jump-to-contact' effects for high resolution imaging. The purely electrical QPlus sensor is based on a quartz tuning fork with a spring constant of ~ 1800 N/m and is the ideal sensor for the detection of short range forces with high resolution. This has been demonstrated by imaging of the rest atoms of the Si(111) 7x7 surface. The QPlus sensor is ideal to be included in STM‘s (VT STM, LT STM, MULTISCAN STM) and also as a complementary sensor for beam deflection instruments.

The Si(111) 7x7 surface with QPlus AFM in an Omicron VT at RT (raw data).

The QPlus sensor is available as AFM option for the VT STM and the VT AFM. It fully replaces the previous needle-sensor technology and provides 2 orders of magnitude better force sensitivity.

Measurement:

A. Bettac, Omicron NanoTechnology

Name and email of corresponding author

a.bettac@omicron.de

This result has been obtained with :
Variable Temperature UHV SPM

RoM Archive

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